Optical signatures of nitrogen acceptors in ZnO
Optical signatures of nitrogen acceptors in ZnO
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DOI:
10.1103/physrevb.85.235204
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发表时间:
2012-06
影响因子:
3.7
通讯作者:
S. Lautenschlaeger;S. Eisermann;G. Haas;E. A. Zolnowski;M. Hofmann;A. Laufer;M. Pinnisch;B. Meyer;M. R. Wagner;J. Reparaz;G. Callsen;A. Hoffmann;A. Chernikov;S. Chatterjee;V. Bornwasser;M. Koch
中科院分区:
文献类型:
--
作者:
S. Lautenschlaeger;S. Eisermann;G. Haas;E. A. Zolnowski;M. Hofmann;A. Laufer;M. Pinnisch;B. Meyer;M. R. Wagner;J. Reparaz;G. Callsen;A. Hoffmann;A. Chernikov;S. Chatterjee;V. Bornwasser;M. Koch
We report on the optical properties of nitrogen acceptor-doped ZnO epilayers in the medium and high doping regimes using temperature and excitation power-dependent, as well as time-resolved photoluminescence experiments. The epilayers were doped with ammonia during homoepitaxial growth on ZnO single-crystal substrates with different surface polarities. Significant differences in the optical characteristics of the epilayers are observed between growth on nonpolar a-plane, polar c-plane Zn-face substrates and polar c-plane O-face substrates, which demonstrates different incorporation of the nitrogen acceptor depending on the substrate polarity. The incorporation of nitrogen into the ZnO films ranges between 1019 and 1021 cm−3 as determined by secondary ionmass spectrometry.Within this doping range the samples change from lightly compensated to highly doped compensated. We discuss the unique photoluminescence features of nitrogen-doped ZnO epilayers within the concept of shallow donor-acceptor-pair recombinations and at the highest doping level by the appearance of potential fluctuations.