Irradiation induced void spheroidization, shrinkage and migration in Cu at elevated temperatures: An in situ study
Irradiation induced void spheroidization, shrinkage and migration in Cu at elevated temperatures: An in situ study
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DOI:
10.1016/j.actamat.2020.10.008
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发表时间:
2020-12
期刊:
影响因子:
9.4
通讯作者:
C. Fan;R. G. S. Annadanam;Z. Shang;Jin Li;Meimei Li;Haiyan Wang;A. El-Azab;Xinghang Zhang
中科院分区:
文献类型:
--
作者:
C. Fan;R. G. S. Annadanam;Z. Shang;Jin Li;Meimei Li;Haiyan Wang;A. El-Azab;Xinghang Zhang
Understanding the void evolution in irradiation environment is of great interest and significance, as irradiation-induced voids typically lead to pronounced volumetric swelling and degradation of mechanical properties.In situstudies on the irradiation response of nanovoids at elevated temperature remain limited. In this work, we performed systematicin situ1 MeV Kr++irradiations on Cu with nanovoids in a transmission electron microscope up to 350 °C. Thein situstudies revealed intriguing void spheroidization, shrinkage and migration. Furthermore, the morphology evolution and migration of nanovoids showed a strong dependence on irradiation temperature and initial void size. Post-irradiation analyses identified defect clusters in the form of stacking fault tetrahedrons, and the remaining large faceted nanovoids. The underlying mechanisms of irradiation-induced void spheroidization and shrinkage were discussed based on phase-field modeling.