Röntgenographische Untersuchung von Spannungszuständen in Werkstoffen Teil IV. Fortsetzung von Matwiss. und Werkstofftechn. Heft 3/1995, S. 148–160, Heft 4/1995, S. 199–216 und Heft 9/1996, S. 426–437
Röntgenographische Untersuchung von Spannungszuständen in Werkstoffen Teil IV. Fortsetzung von Matwiss. und Werkstofftechn. Heft 3/1995, S. 148–160, Heft 4/1995, S. 199–216 und Heft 9/1996, S. 426–437
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重量 3/1995，S.148–160，重量 4/1995，S.199–216 和重量 9/1996，S.426–437
DOI：
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发表时间：
1996
期刊：
影响因子：
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通讯作者：
E. Macherauch
中科院分区：
文献类型：
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作者：
B. Eigenmann;E. Macherauch
材料应力状态的X射线研究
结晶或部分结晶材料的X射线应力分析基于弹性晶格应变的确定，该应变通过弹性理论转化为应力。在20世纪60年代，X射线应力分析的sin2 θ方法和取代薄膜室的衍射仪的发展在随后的三十年中，无论是在基本原理的知识还是在实际应用方面，都在X射线应力分析方面取得了巨大的进步。
本报告概述了X射线应力分析的历史发展，并描述了这一材料科学和工程重要工具的实际技术水平。除了X射线物理学和弹性理论的一些重要元素外，还概述了实际应用的实验方面。描述了标准测量程序和特殊测量问题，并给出了实际解决方案的提示。特别是，破坏性和非破坏性的深度剖析的残余应力的残余应力分析的薄涂层，在多层结构的薄涂层和化学梯度涂层，残余应力分析中存在的纹理，残余应力和加载应力分析的异质材料，在粗晶粒和单晶材料的例子。到目前为止建立的方法进行了解释，并指出了未来可能的发展。
X-Ray Investigation of Stress States in Materials
X-ray stress analyses of crystalline or partially crystalline materials are based on the determination of elastic lattice strains which are converted to stresses by means of theory of elasticity. The development of the sin2Ψ-method of X-ray stress analysis and of diffractometers substituting film chambers during the 1960s initiated an enormous progress in X-ray stress analysis during the following three decades both in respect of the knowledge of the underlying principles and in respect of the practical application.
This report sketches the historical development of X-ray stress analyses and describes the actual state of the art of this important tool for materials science and engineering. Besides some important elements of X-ray physics and theory of elasticity, experimental aspects of practical applications are outlined. Standard measuring procedures and special measuring problems are described and hints for practical solutions are given. In particular, examples of destructive and non-destructive depth profiling of residual stresses of residual stress analyses in thin coatings, in multilayer structures of thin coatings and in chemically graded coatings, of residual stress analyses in presence of textures, of residual and loading stress analyses in heterogeneous materials, in coarse grained, and in single crystalline materials are presented. The methods established up to now are explained and possible future developments are pointed out.