Effect of atomic mobility on the electrochemical properties of a Zr58Nb3Cu16Ni13Al10 bulk metallic glass
Effect of atomic mobility on the electrochemical properties of a Zr58Nb3Cu16Ni13Al10 bulk metallic glass
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原子迁移率对Zr58Nb3Cu16Ni13Al10块体金属玻璃电化学性能的影响
DOI：
10.1016/j.electacta.2018.02.071
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发表时间：
2018-03-20
影响因子：
6.6
通讯作者：
Chamas, Mohamad
中科院分区：
文献类型：
--
作者：
Tang, Junlei;Yu, Liusi;Chamas, Mohamad
块体金属玻璃的腐蚀行为与其微观结构密切相关。化学成分相同的大块金属玻璃的微观结构在一定程度上由原子迁移率来表示。用X射线衍射仪、动态力学分析和维氏硬度测试等方法研究了大块非晶合金Zr58Nb3Cu16Ni13Al10经退火后的组织和力学性能的变化。通过极化曲线、开路电位、电化学阻抗谱和Mott-Schottky分析研究了原子迁移率对333K下1mol/L脱气硫酸溶液中腐蚀行为的影响。动态力学分析表明，原子迁移率降低是由于结构松弛和晶化引起的。电化学测试结果表明，随退火温度的升高，Zr58Nb3Cu16Ni13Al10大块非晶合金的钝化能力降低，耐蚀性下降。Mott-Schottky分析表明，随着原子迁移率的降低，钝化膜中的缺陷浓度增加，平带电势向负电势移动。X射线光电子能谱分析表明，钝化膜的主要化学成分为ZrO2、Al_2O_3和Nb_2O_5。由于强钝化元素(Zr、Al和Nb)的原子迁移率降低，抑制了钝化膜的形成。此外，晶体的析出加速了大块金属玻璃在H_2SO_4中的腐蚀。(C)2018爱思唯尔有限公司。保留所有权利。
The corrosion behaviour of bulk metallic glasses is greatly related to their microstructures. The microstructures in bulk metallic glasses of the same chemical composition are represented to a certain extent by their atomic mobility. Evolution of the microstructure and mechanical properties of Zr58Nb3Cu16Ni13Al10 bulk metallic glass after annealing were studied with X-ray diffraction, dynamic mechanical analysis and Vickers hardness tests. Polarization curve, open circuit potential, electrochemical impedance spectroscopy and Mott-Schottky analysis were performed to investigate the effect of atomic mobility on the corrosion behaviour in 1 mol/L de-aerated H2SO4 at 333 K. Dynamic mechanical analysis indicated that the atomic mobility of Zr58Nb3Cu16Ni13Al10 bulk metallic glass was reduced by structural relaxation and crystallization. All electrochemical measurements showed that the passivation ability decreased and the corrosion resistance of Zr58Nb3Cu16Ni13Al10 bulk metallic glass deteriorated as the annealing temperature increased. Mott-Schottky analysis revealed that the defect concentration in the passive films increased and the flat-band potential shifted to a negative potential with a decrease in the atomic mobility. X-ray photoelectron spectroscopy results proved that the main chemical compositions of the passive films were ZrO2, Al2O3 and Nb2O5. The formation of a passive film was suppressed because the atomic mobility of strong passivating elements (Zr, Al and Nb) decreased. In addition, the precipitation of crystals (Zr2Cu and Cu10Zr7) accelerated the corrosion of the bulk metallic glass in H2SO4. (C) 2018 Elsevier Ltd. All rights reserved.