Investigation of deferred charge effects in Large Synoptic Survey Telescope ITL sensors
Investigation of deferred charge effects in Large Synoptic Survey Telescope ITL sensors
复制标题
大型综合巡天望远镜 ITL 传感器中延迟电荷效应的研究
DOI：
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发表时间：
2019
影响因子：
2.3
通讯作者：
A. Roodman
中科院分区：
文献类型：
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作者：
Adam Snyder;A. Roodman
电荷耦合器件 (CCD) 中电荷传输低效 (CTI) 的传统表征可能存在许多缺陷：CTI 通常仅针对有限数量的信号电平进行计算，CTI 是根据有限数量的像素计算的，并且通常假设 CTI 的来源发生在每个像素到像素的传输中。在对成像技术实验室 (ITL) 开发的用于大型综合巡天望远镜相机焦平面的 CCD 进行初步测试期间，发现了许多连续的 CTI 效应，这促使人们对这些传感器的 CTI 进行更全面的研究。我们的研究描述了对串行延迟电荷效应的更详细检查，以便充分表征在这些传感器的串行过扫描像素中测量的延迟电荷。结果表明，除了每次像素传输时发生的成比例 CTI 损失外，ITL CCD 对串行过扫描像素中测量的延迟电荷也有额外贡献，这可能是由于电荷捕获导致的固定 CTI 损失以及高信号下的电子偏移漂移造成的。
The traditional characterization of charge transfer inefficiency (CTI) in charge-coupled devices (CCDs) can suffer from a number of deficiencies: CTI is often only calculated for a limited number of signal levels, CTI is calculated from a limited number of pixels, and the sources of CTI are usually assumed to occur at every pixel-to-pixel transfer. A number of serial CTI effects have been identified during preliminary testing of CCDs developed by Imaging Technology Laboratory (ITL) for use in the Large Synoptic Survey Telescope camera focal plane that motivated a more comprehensive study of CTI for these sensors. Our study describes a more detailed examination of the serial deferred charge effects in order to fully characterize the deferred charge measured in the serial overscan pixels of these sensors. The results indicate that in addition to proportional CTI loss that occurs at each pixel transfer, ITL CCDs have additional contributions to the deferred charge measured in serial overscan pixels, likely caused by fixed CTI loss due to charge trapping, and an electronic offset drift at high signal.