R.Kuroda, K.Ono and Y.Fukazawa: "A metric for frameworks based on the deviation of the user's understanding from the manufacturer's intension"Proc.on 62^<nd> Annual Conf.of IPSJ.. S-4-11-S-4-12 (2001)
R.Kuroda, K.Ono and Y.Fukazawa: "A metric for frameworks based on the deviation of the user's understanding from the manufacturer's intension"Proc.on 62^<nd> Annual Conf.of IPSJ.. S-4-11-S-4-12 (2001)
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R.Kuroda、K.Ono 和 Y.Fukazawa：“基于用户理解与制造商意图偏差的框架度量”Proc.on 62^<nd> Annual Conf.of IPSJ.. S-4-11
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