Fatigue and Aging in Sol-Gel Derived PZT Thin Films
Fatigue and Aging in Sol-Gel Derived PZT Thin Films
复制标题
溶胶-凝胶衍生的 PZT 薄膜的疲劳和老化
DOI：
10.1557/proc-200-277
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发表时间：
1990
期刊：
影响因子：
--
通讯作者：
W. Shepherd
中科院分区：
文献类型：
--
作者：
W. Shepherd
典型的疲劳和老化特性的报告使用溶胶-凝胶制备的PZT薄膜。疲劳过程分两步进行。有一个初始阶段，在此期间，所形成的膜的域矩阵被重构的循环和极化一般增加，随后由一个时期，其中的极化衰减。极化衰减可能部分是由于在电极处形成介电层。报道了电压和温度对疲劳的影响。老化作为温度的函数进行检查。内部偏置场的测量不支持它们是老化的主要原因的观点。疲劳和老化都不是温度敏感的，这使得识别特定的物理过程变得困难。
Typical fatigue and aging characteristics are reported for thin PZT films prepared using sol-gels. The fatigue process occurs in two steps. There is an initial period, during which the domain matrix of the as formed film is restructured by the cycling and the polarization generally increases, followed by a period in which the polarization decays. The polarization decay may be due, in part, to the formation of dielectric layers at the electrodes. The effects of voltage and temperature on fatigue are reported. Aging is examined as a function of temperature. Measurements of internal bias fields do not support the view that they are the primary cause of aging. Neither fatigue nor aging are temperature sensitive making identification of specific physical processes difficult.