Scanning Line Probe Microscopy: Beyond the Point Probe
Scanning Line Probe Microscopy: Beyond the Point Probe
复制标题
扫描线探针显微镜：超越点探针
DOI：
10.1021/acs.analchem.8b02852
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发表时间：
2018
影响因子：
7.4
通讯作者：
Esposito, Daniel V.
中科院分区：
文献类型：
--
作者：
O’Neil, Glen D.;Kuo, Han-wen;Lomax, Duncan N.;Wright, John;Esposito, Daniel V.
扫描探针显微镜（SPM）技术已成为研究纳米和微米级材料和工艺不可或缺的工具，但受到分辨率和面积扫描速率之间的权衡，限制了它们的实用性的一些应用程序和样品类型。在这里，我们提出了一种新的方法SPM成像的基础上结合非局部扫描线探头与压缩传感（CS）信号分析方法。使用扫描电化学显微镜（SECM）作为一个范例SPM技术，我们证明了这种方法使用连续的微带电极，或线探针，这是用来执行化学成像的电催化铂盘沉积在惰性基板上。这些结果证明了使用非局部扫描探头和CS图像重建实现高面积SPM成像率的潜力。
Scanning probe microscopy (SPM) techniques have become indispensable tools for studying nano- and microscale materials and processes but suffer from a trade-off between resolution and areal scan rate that limits their utility for a number of applications and sample types. Here, we present a novel approach to SPM imaging based on combining nonlocal scanning line probes with compressed sensing (CS) signal analysis methods. Using scanning electrochemical microscopy (SECM) as an exemplar SPM technique, we demonstrate this approach using continuous microband electrodes, or line probes, which are used to perform chemical imaging of electrocatalytic Pt discs deposited on an inert substrate. These results demonstrate the potential to achieve high areal SPM imaging rates using nonlocal scanning probes and CS image reconstruction.