BEAM WAIST AND M(2) MEASUREMENT USING A FINITE SLIT
BEAM WAIST AND M(2) MEASUREMENT USING A FINITE SLIT
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DOI：
10.1117/12.169739
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发表时间：
1994-07-01
影响因子：
1.3
通讯作者：
CHAPPLE, PB
中科院分区：
文献类型：
--
作者：
CHAPPLE, PB
激光束轮廓可以通过几种技术来实现，这些技术具有不同程度的精度。对于用M2参数描述近高斯光束，扫描狭缝法是一种方便、准确的成像技术。描述了紧聚焦调q激光束的轮廓。对于有限的狭缝尺寸，可以非常简单地进行校正，狭缝宽度不必比腰半径小得多。这种校正也可以应用于CCD相机测量技术中，对非零像素尺寸进行一定的校正。
Laser beam profiling can be accomplished by several techniques, which have different degrees of accuracy. For the description of near-Gaussian beams using the M2 parameter, the scanning slit method is a convenient and accurate profiling technique. The profiling of a tightly focused Q-switched laser beam is described. It is possible to correct very simply for the finite slit size, and it is not necessary for the slit width to be much less than the waist radius. This correction can also be applied in the CCD camera measurement technique, in which some correction can be made for the nonzero pixel size.