Ultraviolet and visible spectral imaging of hydrogen flames using an organic photoconductive film CMOS imager
Ultraviolet and visible spectral imaging of hydrogen flames using an organic photoconductive film CMOS imager
复制标题
使用有机光电导薄膜 CMOS 成像仪对氢火焰进行紫外和可见光谱成像
DOI:
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发表时间:
2017
期刊:
影响因子:
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通讯作者:
T. Tanaka
中科院分区:
文献类型:
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作者:
T. Okino;S. Yamahira;S. Yamada;Y. Hirose;A. Odagawa;Y. Kato;T. Tanaka
We have developed a real time ultra-violet (UV) imaging system that can visualize invisible hydrogen flame together with a visible (VIS) background scene in outdoor environment. As a UV/VIS image sensor, an organic photoconductive film (OPF) imager is employed. The OPF has intrinsically higher sensitivity in the UV wavelength region than those of conventional consumer CMOS image sensors (CIS) or Charge Coupled Devices (CCD). Imaging of hydrogen flame is realized by subtracting a high level background VIS image from a UV hydrogen flame image overlapped on the background. The system is capable of imaging a weaker hydrogen flame signals by 4 orders of magnitude than that of VIS background. It is applicable not only to future hydrogen supply stations but also to other UV/VIS monitor systems requiring solar blind imaging. INTRODUCTION Fuel cells using hydrogen are considered to be a primary candidate for next generation power sources causing no load of environment. Along this roadmap, construction of the hydrogen supply stations has been started in several countries [1]. A major concern in safety issues in these systems lies in the fact that hydrogen becomes extremely flammable due to lowering of the ignition energy when mixed with air in a relative contents range of 10% to 60% [2]. Furthermore, because the emission band head of the hydrogen flame lies in a ultra-violet (UV) region (~310 nm), it is invisible to human eyes. A worst and actually reported scenario is that human beings pass through the invisible hydrogen flame caused by accidentally leaking hydrogen from a high pressure tank ignited near the leaking point [1]. Therefore, in these stations, it is important to immediately and accurately detect hydrogen flames within an ordinary background scene. To this end, an imaging system that visualizes both UV and visible (VIS) light scenes are required. In addition, the light intensity of hydrogen flame is extremely small (typically 1~10 nW/cm2) against background VIS light (in the case of daytime sunlight, it is about 105 lux). In order to visualize hydrogen flame, the imaging system should be able not only to detect hydrogen UV (~310 nm) signals, but also to separate them from high background VIS signals. In this regard, the sensitivity of ordinary Si CMOS image sensor (CIS) in UV region is not sufficiently high except for a specially made CIS in which the quantum efficiency of UV light is enhanced [3]. Although UV sensing material, i.e. AlGaN, based sensors with high sensitivity in a UV range have been reported, they are incapable of imaging VIS light [4]. In this work, we have developed an ultra-violet and visible (UV+VIS) imaging system based on an organic photoconductive film (OPF) imager. The OPF has intrinsically high sensitivity in the entire wavelength region desired, i.e. from UV to VIS regions. Imaging of hydrogen flame is realized by subtracting a high level background VIS image from a UV hydrogen flame image overlapped on the background. This image process is carried out in each frame resulting in a real time monitoring. It is shown that the system is capable of imaging a weak hydrogen flame signals from a 4 orders of magnitude higher VIS background signals. ADVANTAGE OF OPF IMAGER Major advantages of the OPF imager as the hydrogen imager are two folds. Firstly, as shown in Fig. 1, the OPF imager has high quantum efficiency both in the VIS and the UV regions as compared with those of ordinary CIS or reported UV sensing materials. Fig.1: Quantum efficiency spectra of our OPF CMOS imager (red), a Si CIS (black) and an AlGaN photodiode (blue) [4].
影响因子:
1.8
作者:
R. Ono;M. Nifuku;S. Fujiwara;Sadashige Horiguchi;T. Oda
通讯作者:
R. Ono;M. Nifuku;S. Fujiwara;Sadashige Horiguchi;T. Oda