Helium addition effect on the remote-plasma-enhanced etching of silicon-related materials using anhydrous hydrogen fluoride gas

Helium addition effect on the remote-plasma-enhanced etching of silicon-related materials using anhydrous hydrogen fluoride gas
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氦添加对无水氟化氢气体远程等离子体增强硅相关材料刻蚀的影响

DOI:
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发表时间:
2003
期刊:
Proc.International Conference on Electrical Engineering 2003 067
影响因子:
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通讯作者:
Y.Saito
Y.Saito
中科院分区:
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文献类型:
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作者:
N.Nakamura;Y.Saito

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