Shear-strain-induced low symmetry phase and domain ordering in epitaxial La0.7Sr0.3MnO3 thin films
Shear-strain-induced low symmetry phase and domain ordering in epitaxial La0.7Sr0.3MnO3 thin films
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DOI：
10.1063/1.2952764
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发表时间：
2008-06
影响因子：
4
通讯作者：
Shaowei Jin;Guan-Yin GAO;Zhen Huang;Z. Yin;X. Zheng;Wenbin Wu
中科院分区：
文献类型：
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作者：
Shaowei Jin;Guan-Yin GAO;Zhen Huang;Z. Yin;X. Zheng;Wenbin Wu
用(003)，(103)，(103)，(103)，(013)和(01‘3)高分辨散射区反射的X射线倒易空间图和透射电子显微镜研究了在(LaAlO_3)_(0.3)(Sr_2AlTaO_6)_(0.7)(001)衬底上生长的La0.7Sr0.3MnO_3薄膜的磁区结构。我们发现，在20 nm以上，薄膜明显呈现出低对称性的单斜相，剪切应变弛豫可以在薄膜中诱导出图案化的磁畴结构和面内超晶格。讨论了磁区宽度与薄膜厚度的关系以及剪切应变对薄膜居里温度的影响。
The domain structure in epitaxial La0.7Sr0.3MnO3 films grown on (LaAlO3)0.3(Sr2AlTaO6)0.7(001) substrates has been investigated by x-ray reciprocal space maps on (003), (103), (1¯03), (013), and (01¯3) reflections in the high-resolution scattering zone containing the c* axis, and the transmission electron microscopy. We revealed that at above 20nm, the films show clearly a low symmetry monoclinic phase, and the shear strain relaxation can induce a patterned domain structure and in-plane superlattice in the films. The domain width versus the film thickness and the shear strain effect on the Curie temperature of the films were also discussed.