Loss tangent measurements of dielectric substrates from 15K to 300K with two resonators: investigation into accuracy issues
Loss tangent measurements of dielectric substrates from 15K to 300K with two resonators: investigation into accuracy issues
复制标题
使用两个谐振器对 15K 至 300K 介电基板进行损耗角正切测量：精度问题调查
DOI：
10.1109/apmc.2005.1606805
复制
发表时间：
2005
期刊：
影响因子：
--
通讯作者：
J. Krupk
中科院分区：
文献类型：
--
作者：
J. Mazierska;M. Jacob;D. Ledenyov;J. Krupk
使用两个TE/sub 01/spl δ //介质谐振器在不同温度下测量中、低和极低损耗介质衬底（包括Rogers RT Duroid 5880和6010.2、LaAlO/sub 3/、LSAT、MgO和石英）的损耗正切，以确保测试的验证。对超导单柱谐振器和铜分柱谐振器在15K ~ 300K温度范围内的测量精度进行了研究和讨论。
Loss tangent of medium, low and very low loss dielectric substrates (including Rogers RT Duroid 5880 and 6010.2, LaAlO/sub 3/, LSAT, MgO and quartz) was measured at varying temperatures with two TE/sub 01/spl delta// dielectric resonators to ensure verification of the tests. Accuracy of the measurements has been investigated and discussed for a superconducting single post and a copper split post resonators in a temperature range from 15K to 300K.