Thickness-dependent magnetooptical properties of ion beam sputtered polycrystalline Ce1Y2Fe5O12 films
Thickness-dependent magnetooptical properties of ion beam sputtered polycrystalline Ce1Y2Fe5O12 films
复制标题
DOI：
10.1016/j.optmat.2022.112967
复制
发表时间：
2022-09-29
影响因子：
3.9
通讯作者：
Goto，Taichi
中科院分区：
文献类型：
--
作者：
Yoshihara，Yuki;Sugita，Tomoya;Goto，Taichi
采用离子束溅射方法在不同厚度的合成熔融石英衬底上制备了Ce：YIG，Ce1Y2Fe5O12多晶薄膜，测量了薄膜的粗糙度、透过率、光学常数、微结构以及磁性和磁光性能。较厚的薄膜由于热失配应力而出现开裂。在Ce：YIG与衬底的界面处观察到一层厚度为5 nm的∼非晶层，这导致了测量性能的非单调厚度依赖关系。338 nm厚的Ce：YIG薄膜显示出最大的磁光优值，其磁光优值定义为法拉第旋转角与吸收系数之比，在波长为1550 nm时达到127°/分贝，是以前工作的三倍多。
Polycrystalline cerium-substituted yttrium iron garnet (Ce:YIG, Ce1Y2Fe5O12) films were deposited on synthetic fused silica substrates with various thicknesses using ion beam sputtering, and their roughness, transmissivity, optical constants, microstructure, and their magnetic and magnetooptical properties were measured. Thicker films exhibit cracking due to thermal mismatch stress. A ∼5 nm thick amorphous layer was observed at the interface between Ce:YIG and the substrates, resulting in a non-monotonic thickness dependence of the measured properties. A 338 nm thick Ce:YIG film showed the largest magnetooptical figure of merit defined as the ratio of Faraday rotation angle to absorption coefficient, 127°/dB at a wavelength of 1550 nm, more than three times larger than prior work.