APPLICATION OF INDUCTIVELY COUPLED PLASMA SOURCE-MASS SPECTROMETRY (ICP-MS) TO THE DETERMINATION OF TRACE-METALS IN ORGANICS
APPLICATION OF INDUCTIVELY COUPLED PLASMA SOURCE-MASS SPECTROMETRY (ICP-MS) TO THE DETERMINATION OF TRACE-METALS IN ORGANICS
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DOI：
10.1039/ja9860100259
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发表时间：
1986-08-01
影响因子：
3.4
通讯作者：
HUTTON, RC
中科院分区：
文献类型：
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作者：
HUTTON, RC
本文讨论了电感耦合等离子体质谱法测定有机基质中微量元素的最佳条件。通过使用引入到雾化器气体中并由质量流量控制器控制的低流量氧气，消除了颗粒碳在采样器孔上冷凝所经历的问题。获得的背景光谱由低质量（<80 a.m.u.）的几个简单分子质量离子组成。这些降低了一些元素的检测限，然而，常用溶剂中的空白污染问题被视为检测能力的限制因素。检测限一般低于ng ml-1的水平，但对于大多数元素，可与运行水溶液的类似系统所报告的水平相媲美。
The optimum conditions necessary for the determination of trace elements in organic based materials by ICP-MS are discussed. Problems experienced with condensation of particulate carbon on the sampler orifice have been eliminated by the use of a low flow of oxygen introduced into the nebuliser gas and controlled by a mass flow controller. The background spectra obtained are composed of a few simple molecular mass ions at low mass (<80 a.m.u.). These degrade detection limits for a few elements, however the problem of blank contamination in the commonly used solvents is seen as the limiting factor in detection power. Detection limits are in general below ng ml–1 levels however for most elements, comparable to those reported for a similar system running aqueous solutions.