High-resolution and large dynamic range nanomechanical mapping in tapping-mode atomic force microscopy
High-resolution and large dynamic range nanomechanical mapping in tapping-mode atomic force microscopy
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DOI：
10.1088/0957-4484/19/44/445717
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发表时间：
2008-11-05
期刊：
影响因子：
3.5
通讯作者：
Erina, Natalia
中科院分区：
文献类型：
--
作者：
Sahin, Ozgur;Erina, Natalia
材料特性的高空间分辨率成像是纳米材料持续发展和生物系统研究的一项重要任务。敲击模式原子力显微镜中振动尖端和样品之间随时间变化的相互作用力包含有关样品的弹性、粘合和耗散响应的详细信息。我们报告了利用最近引入的扭转谐波悬臂梁对时变尖端-样品相互作用力的实时测量和分析。通过这些测量，可以在单次扫描中同时生成弹性模量、粘附力、能量耗散和形貌的高分辨率图。峰值攻丝力低至 0.6 nN，我们演示了对特征尺寸为 1、10 和 500 nm 的混合聚合物和自组装分子结构的测量。我们还观察到，在相同的反馈条件下，单个悬臂的弹性模量测量范围为四个数量级（1 MPa 至 10 GPa），这对于分析材料成分差异很大的异质样品特别有用。
High spatial resolution imaging of material properties is an important task for the continued development of nanomaterials and studies of biological systems. Time-varying interaction forces between the vibrating tip and the sample in a tapping-mode atomic force microscope contain detailed information about the elastic, adhesive, and dissipative response of the sample. We report real-time measurement and analysis of the time-varying tip-sample interaction forces with recently introduced torsional harmonic cantilevers. With these measurements, high-resolution maps of elastic modulus, adhesion force, energy dissipation, and topography are generated simultaneously in a single scan. With peak tapping forces as low as 0.6 nN, we demonstrate measurements on blended polymers and self-assembled molecular architectures with feature sizes at 1, 10, and 500 nm. We also observed an elastic modulus measurement range of four orders of magnitude (1 MPa to 10 GPa) for a single cantilever under identical feedback conditions, which can be particularly useful for analyzing heterogeneous samples with largely different material components.