Low-acceleration-voltage electron irradiation damage in single-walled carbon nanotubes
Low-acceleration-voltage electron irradiation damage in single-walled carbon nanotubes
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DOI：
10.1143/jjap.43.l1118
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发表时间：
2004-08-15
期刊：
影响因子：
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通讯作者：
Fukuba, SY
中科院分区：
文献类型：
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作者：
Suzuki, S;Kanzaki, K;Fukuba, SY
采用共振拉曼光谱研究了低加速电压电子辐照对单壁碳纳米管的影响。研究发现，0.5至25 kV加速电压下的照射会消除纳米管的特征光学性质，并降低其对空气中退火的耐受性，这表明普通扫描电子显微镜观察不可避免地会损坏纳米管。 1 kV左右的加速电压造成的破坏最为广泛。缺陷较少的单壁碳纳米管被发现对辐射损伤具有更高的耐受性。
Low-acceleration-voltage electron irradiation effects on single-walled carbon nanotubes were studied by resonant Raman spectroscopy. The irradiation at acceleration voltages of 0.5 to 25 kV was found to extinguish the characteristic optical property of the nanotubes and reduce their tolerance against annealing in air, indicating that the nanotubes are inevitably damaged by ordinary scanning electron microscope observation. The acceleration voltage of around 1 kV caused the most extensive damage. Less defective SWNTs were found to have a higher tolerance against the irradiation damage.