Pull-in instability of electrically actuated poly-SiGe graded micro-beams

Pull-in instability of electrically actuated poly-SiGe graded micro-beams
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电驱动多晶硅Ge梯度微梁的拉入不稳定性

DOI：
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发表时间：
2013
期刊：
影响因子：
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通讯作者：
S. Kitipornchai
S. Kitipornchai
中科院分区：
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文献类型：
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作者：
X. Jia;S. M. Zhang;Jie Yang;S. Kitipornchai

文献摘要

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研究了在静电力、分子间力和温度变化的共同作用下，功能梯度多晶硅硅微梁的吸合不稳定性。采用指数分布模型和Voigt模型对功能梯度材料进行了分析。利用虚功原理导出了非线性控制微分方程，并采用微分求积法（DQM）求解。参数研究表明，材料组成，几何非线性，温度变化和分子间Casimir力的显着影响。
This paper investigates the pull-in instability of functionally graded poly-SiGe micro-beams under the combined electrostatic and intermolecular forces and temperature change. The exponential distribution model and Voigt model are used to analyze the functionally graded materials (FGMs). Principle of virtual work is used to derive the nonlinear governing differential equation which is then solved using differential quadrature method (DQM). A parametric study is conducted to show the significant effects of material composition, geometric nonlinearity, temperature change and intermolecular Casimir force.