Simplified neutral atom microscopy
Simplified neutral atom microscopy
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简化的中性原子显微镜
DOI：
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发表时间：
2011
期刊：
影响因子：
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通讯作者：
E. Sánchez
中科院分区：
文献类型：
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作者：
P. Witham;E. Sánchez
几十年来，科学家们一直对使用中性电荷原子或分子的聚焦束成像表面的可能性感兴趣。中性原子的散射提供了一种低能量、表面敏感的探针，用它成像可能会带来新的见解。然而，很难形成一个清晰聚焦和足够强的中性粒子束。2008年发表了第一张来自这种显微镜的图像。我们成功地采用了一种新的方法，使用针孔光学和机械扫描样品。分辨率达到3 μm。介绍了最近的图像和设计理论。
For some decades scientists have been interested the possibility of imaging surfaces using a focused beam of neutrally charged atoms or molecules. Scattering of neutral atoms provides a low-energy, surface-sensitive probe, and imaging with this could result in new insights. However, it has been difficult to form a sharply focused and sufficiently intense beam of neutral particles. The first image from such a microscope was published in 2008. We have succeeded with a new approach, using pinhole optics and a mechanically scanned sample. Resolution has reached 3 µm. Recent images and design theory are presented.