An efficient approach to constrained via minimization for two-layer VLSI routing
An efficient approach to constrained via minimization for two-layer VLSI routing
复制标题
一种有效的两层 VLSI 布线约束通孔最小化方法
DOI:
10.1109/aspdac.1999.759982
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发表时间:
1999
期刊:
影响因子:
--
通讯作者:
H. Cheung
中科院分区:
文献类型:
--
作者:
Maolin Tang;K. Eshraghian;H. Cheung
Constrained via minimization is the problem of reassigning wire segments of a VLSI routing so that the number of vias is minimized. In this paper, a new approach is proposed for two-layer VLSI routing. This approach is able to handle any types of routing, and allows arbitrary number of wire segments split at a via candidate.