TEM observations of radiation damage in tungsten irradiated by 20 MeV W ions
TEM observations of radiation damage in tungsten irradiated by 20 MeV W ions
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DOI：
10.1016/j.nimb.2013.03.022
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发表时间：
2013-12-15
影响因子：
1.3
通讯作者：
Kurzydlowski, K. J.
中科院分区：
文献类型：
--
作者：
Ciupinski, L.;Ogorodnikova, O. V.;Kurzydlowski, K. J.
用20 MeV的W6+离子注入多晶、再结晶W靶，模拟核聚变中子造成的辐射损伤。累积损伤分别为0.01、0.1和0.89 dpa。用透射电镜（TEM）对各样品的近表面区进行了分析。为此，利用聚焦离子束（FIB）铣削出垂直于靶植入表面的片层。从未辐照的、再结晶的W靶中制备了一个参考薄片，以估计FIB处理过程中引入的损伤。透射电镜研究表明，损伤区具有复杂的微观结构及其随损伤累积程度的演变。实验观察到的损伤深度与使用离子在物质中的停止和范围（SRIM）软件计算得到的损伤深度非常吻合。(C) 2013 Elsevier B.V.版权所有
Polycrystalline, recrystallized W targets were subjected to implantation with 20 MeV W6+ ions in order to simulate radiation damage caused by fusion neutrons. Three samples with cumulative damage of 0.01, 0.1 and 0.89 dpa were produced. The near-surface zone of each sample has been analyzed by transmission electron microscopy (TEM). To this end, lamellae oriented perpendicularly to the targets implanted surface were milled out using focused ion beam (FIB). A reference lamella from non-irradiated, recrystallized W target was also prepared to estimate the damage introduced during FIB processing. TEM studies revealed a complex microstructure of the damaged zones as well as its evolution with cumulative damage level. The experimentally observed damage depth agrees very well with the one calculated using the Stopping and Range of Ions in Matter (SRIM) software. (C) 2013 Elsevier B.V. All rights reserved.