The application of back-scattered electron imaging for characterization of pearlitic steels
The application of back-scattered electron imaging for characterization of pearlitic steels
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DOI：
10.1007/s11431-011-4500-3
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发表时间：
2011-07
期刊：
影响因子：
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通讯作者：
N. Guo;Qing Liu;Y. Xin;B. Luan;Zheng Zhou
中科院分区：
文献类型：
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作者：
N. Guo;Qing Liu;Y. Xin;B. Luan;Zheng Zhou
珠光体钢线材和钢丝的显微组织通常采用扫描电子显微镜二次电子成像(SEI)技术进行表征。本文提出了用背散射电子成像法(BSEI)测定具有纳米级珠光体片层的未变形和变形珠光体钢的显微组织。结果表明，BSEI技术能真实地表征珠光体片层，是定量测量珠光体片层平均尺寸的有效方法。在一定程度上，BSEI法比SEI法更适合于研究未变形和不严重变形的珠光体钢。
The microstructures of pearlitic steel wire rods and steel wires are commonly characterized by secondary electron imaging (SEI) technique using scanning electron microscopy (SEM). In this work, a back-scattered electron imaging (BSEI) method is proposed to determine the microstructures of undeformed and deformed pearlitic steels with nanometer scale pearlite lamellae. The results indicate that BSEI technique can characterize the pearlite lamellas veritably and is effective in quantitative measurement of the mean size of pearlite interlamellar spacing. To some extent, BSEI method is more suitable than SEI technique for studying undeformed and not severely deformed pearlitic steels.