Characterization and compensation of OLED aging in a digital AMOLED system
Characterization and compensation of OLED aging in a digital AMOLED system
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DOI：
10.1002/jsid.401
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发表时间：
2015-12
影响因子：
2.3
通讯作者：
Pascal Volkert;Xingtong Jiang;Chihao Xu
中科院分区：
文献类型：
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作者：
Pascal Volkert;Xingtong Jiang;Chihao Xu
有机发光二极管（OLED）老化是残影的根本原因，被认为是除了有源矩阵有机发光二极管（AMOLED）显示器的低良率问题之外最棘手的问题。数字驱动可以消除 Mura 伪影并实现与 LCD 类似的良率。但OLED比模拟驱动更容易老化，从而寿命会变短。在本文中，我们采用测量像素电流和补偿 OLED I-V 漂移的方法。在显示器的使用寿命期间从电气测量中获得的信息可能与电光漂移相关，特别是电流效率。老化模型必须考虑 I-V 漂移和效率损失对每个子帧的工作点/电压的依赖性。已经开发了特定的补偿算法。两个 AMOLED 原型（1.5 英寸和 2.8 英寸）经过验证。烧坏的图案可以得到补偿，因此这个概念已被证明是有效的。通过本文描述的方法，数字 AMOLED 可以达到与模拟 AMOLED 相似甚至更高的寿命。
Organic light‐emitting diode (OLED) aging is the root cause for image sticking artifact and considered as the toughest problem besides the low yield problem of active‐matrix organic light‐emitting diode (AMOLED) displays. Digital driving can eliminate Mura artifact and allow a similar yield like LCD. However, it is more prone to OLED aging than analog driving, so that the lifetime will become shorter. In this paper, we pursue the approach to measure the pixel current and compensate OLED I–V drift. Information gained from electrical measurements during the lifetime of the display may be correlated to electro‐optical drift, particularly the current efficiency. The aging model has to consider the dependence of I–V drift and efficiency loss on the operation point/voltage for each subframe. Specific compensation algorithms have been developed. Two AMOLED prototypes (1.5 and 2.8 in.) were validated. Burned‐in pattern can be compensated, so the concept has been proven as effective. With the method described in this paper, digital AMOLED may reach a similar and even significantly higher lifetime than an analog AMOLED.