An interlaboratory comparison of X-ray computed tomography measurement for texture and dimensional characterisation of additively manufactured parts
An interlaboratory comparison of X-ray computed tomography measurement for texture and dimensional characterisation of additively manufactured parts
复制标题
DOI：
10.1016/j.addma.2018.08.013
复制
发表时间：
2018-10
影响因子：
11
通讯作者：
A. Townsend;R. Racasan;R. Leach;N. Senin;A. Thompson;A. Ramsey;D. Bate;P. Woolliams;Stephen Brown;L. Blunt
中科院分区：
文献类型：
--
作者：
A. Townsend;R. Racasan;R. Leach;N. Senin;A. Thompson;A. Ramsey;D. Bate;P. Woolliams;Stephen Brown;L. Blunt
本文介绍了CT-STARR （CT-Surface Texture for Additive Round Robin）阶段1实验室间比较的结果。该研究比较了从四个实验室的五个x射线计算机断层扫描（CT）体积测量中获得的根据ISO 25178-2提取面表面纹理数据的结果。两个Ti6Al4V ELI（超低间隙）成分包括在每个CT图像中。第一个组件是使用Arcam Q10电子束熔化（EBM）机制造的增材制造（AM）立方体。从该零件的CT扫描中提取表面纹理数据。报告了ISO 25178-2中选定参数的值，包括算术平均高度sa，其中尼康MCT 225计量CT测量值均在平均参考焦距变化测量值的0.5%以内。讨论了CT分辨率要求。第二个组件是一个加工尺寸测试伪影，旨在促进CT全局体素缩放误差和表面确定误差的独立分析。报道了对尺寸伪影数据进行数学全局标度和表面确定校正的结果。经数学修正后，XT H 225商用CT的长度、外径和内径尺寸测试伪影误差分别从-0.27%、-0.83%和-0.54%降至0.02%以下。这项工作将有助于开发表面纹理校正协议，帮助定义CT表面测量包络限制，并为扩展的第二阶段实验室间比较提供有价值的信息，这将包括更多样化的CT系统和技术，进一步扩展CT表面知识库。
This paper presents the results of the CT-STARR (CT-Surface Texture for Additive Round Robin) Stage 1 interlaboratory comparison. The study compared the results obtained for the extraction of areal surface texture data per ISO 25178-2 from five X-ray computed tomography (CT) volume measurements from each of four laboratories. Two Ti6Al4V ELI (extra-low interstitial) components were included in each of the CT acquisitions. The first component was an additively manufactured (AM) cube manufactured using an Arcam Q10 electron beam melting (EBM) machine. Surface texture data was extracted from CT scans of this part. The values of selected parameters per ISO 25178-2 are reported, includingSa, the arithmetic mean height, for which the values from the Nikon MCT 225 metrology CT measurements were all within 0.5% of the mean reference focus variation measurement. CT resolution requirements are discussed. The second component was a machined dimensional test artefact designed to facilitate independent analysis of CT global voxel scaling errors and surface determination errors. The results of mathematical global scaling and surface determination correction of the dimensional artefact data is reported. The dimensional test artefact errors for the XT H 225 commercial CT for length, outside diameter and inside diameter reduced from -0.27%, -0.83% and -0.54% respectively to less than 0.02% after performing mathematical correction. This work will assist the development of surface texture correction protocols, help define surface-from-CT measurement envelope limits and provide valuable information for an expanded Stage 2 interlaboratory comparison, which will include a more diverse range of CT systems and technologies, further expanding the surface-from-CT knowledge base.