Thickness-driven spin reorientation transition in ultrathin films
Thickness-driven spin reorientation transition in ultrathin films
复制标题
DOI：
10.1007/s11433-012-4975-3
复制
发表时间：
2013-01
期刊：
影响因子：
--
通讯作者：
B. Miao;Y. Millev;Liang Sun;B. You;Wei Zhang;H. Ding
中科院分区：
文献类型：
--
作者：
B. Miao;Y. Millev;Liang Sun;B. You;Wei Zhang;H. Ding
我们回顾了最近的研究，通过不同的实验手段的薄膜，表现出厚度驱动的自旋重取向转变（SRT）。该阶段是通过确定，通过现象学热力学描述，相关的相图的可能类型的SRT和不施加磁场。可以选择合适的表示，使得最佳地利用各向异性空间中系统路径的线性特征（在厚度变化下）。后者涉及高阶体和表面各向异性在一个实质性的方式。我们研究敏感的实验技术，如磁光克尔效应（MOKE）的磁滞测量，利用扫描电子显微镜与极化分析（SEMPA），光电子发射电子显微镜（PEEM）和自旋极化低能电子显微镜（SPLEEM）的微磁学研究，以及通过MOKE的磁化率测量SRT的检测和定量。最后讨论的关键问题，包括确定可靠的实验指纹是否一个给定的SRT收益通过共存相或通过锥（倾斜）相。我们演示了如何应用的一般理论思想，精心设计的测量导致在任何超薄薄膜SRT，即表面（界面）磁各向异性常数的最重要的材料参数的确定。评论的结论是我们个人的未来有前途的工作SRT的大纲。
We review recent studies by different experimental means of ultrathin films, exhibiting thickness-driven spin reorientation transitions (SRTs). The stage is set by determining, via phenomenological thermodynamic description, of the relevant phase diagrams for the possible types of SRT with and without applied magnetic field. Suitable representation may be chosen such that best use is made of the linear character (under thickness variation) of the system’s path in anisotropy space. The latter involves higher-order bulk and surface anisotropies in a substantial way. We examine sensitive experimental techniques for the detection and quantification of SRTs, such as hysteresis measurements with magneto-optical Kerr effect (MOKE), micromagnetic studies utilizing scanning electron microscopy with polarization analysis (SEMPA), photoemission electron microscopy (PEEM) and spin-polarized low-energy electron microscopy (SPLEEM) as well asacmagnetic susceptibility measurements via MOKE. Key issues are conclusively discussed including the identification of reliable experimental fingerprints about whether a given SRT proceeds via a phase of coexistence or via a cone (canted) phase. We demonstrate how the application of the general theoretical ideas to carefully designed measurements leads to the determination of the most important material parameters in any ultrathin-film SRT, namely, the surface (interface) magnetic anisotropy constants. The review concludes by our personal outline for future promising work on SRTs.