New Analysis Method for Time-Dependent Device-To-Device Variation Accounting for Within-Device Fluctuation
New Analysis Method for Time-Dependent Device-To-Device Variation Accounting for Within-Device Fluctuation
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DOI：
10.1109/ted.2013.2270893
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发表时间：
2013-07
影响因子：
3.1
通讯作者：
M. Duan;J. Zhang;Z. Ji;W. Zhang;B. Kaczer;T. Schram;R. Ritzenthaler;G. Groeseneken;A. Asenov
中科院分区：
文献类型：
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作者：
M. Duan;J. Zhang;Z. Ji;W. Zhang;B. Kaczer;T. Schram;R. Ritzenthaler;G. Groeseneken;A. Asenov
纳米尺寸器件的可变性是电路设计的主要挑战。除了作为制造的可变性，制造后退化引入了一个时间依赖性的可变性，起源于电荷的位置和数量的统计分布。现有的表征技术并不总是捕获最大的降解。其中一些也没有将设备间的变化与同一设备内的充电波动分开。本文的目的是开发一种新的分析方法来表征时间相关的设备到设备的变化，占设备内波动（TVF）。TVF捕获最大退化，将器件间变化与器件内波动分开，并将数据点减少三个数量级。结果表明，流行的数据采集在离散的时间点不捕捉波动以及漏极电流必须连续测量。的TVF表明，降解有两个组件-随时间的波动和一个在给定的偏置下观察不到的放电。虽然两者都随着胁迫时间的增加而增加，但它们之间的相关性很弱，表明两种不同的起源。
Variability of nanometer-size devices is a major challenge for circuit design. Apart from the as-fabricated variability, the postfabrication degradation introduces a time-dependent variability, originating from statistical distribution of charge location and number. The existing characterization techniques do not always capture the maximum degradation. Some of them does not separate the device-to-device variation from the charging fluctuation within the same device, either. The objective of this paper is to develop a new analysis method for characterizing time-dependent device-to-device variation, accounting for within-device fluctuation (TVF). The TVF captures the maximum degradation, separate device-to-device variation from within-device fluctuation, and reduce the data points by three orders of magnitude. It is shown that the popular data acquisition at discrete time points does not capture the fluctuation well and drain current must be measured continuously. The TVF shows that degradation has two components-a fluctuation with time and one whose discharge is not observed under a given bias. Although both of them increase with stress time, the correlation between them is weak, indicating two different origins.