Low-energy calibration of XENON1T with an internal $$^{{\textbf {37}}}$$Ar source
Low-energy calibration of XENON1T with an internal $$^{{\textbf {37}}}$$Ar source
复制标题
使用内部 $$^{{ extbf {37}}}$$Ar 源对 XENON1T 进行低能校准
DOI：
10.1140/epjc/s10052-023-11512-z
复制
发表时间：
2023
期刊：
影响因子：
--
通讯作者：
Antochi, V. C.
中科院分区：
文献类型：
--
作者：
Aprile, E.;Abe, K.;Agostini, F.;Ahmed Maouloud, S.;Alfonsi, M.;Althueser, L.;Andrieu, B.;Angelino, E.;Angevaare, J. R.;Antochi, V. C.
A low-energy electronic recoil calibration of XENON1T, a dual-phase xenon time projection chamber, with an internal 37Ar source was performed. This calibration source features a 35-day half-life and provides two mono-energetic lines at 2.82 keV and 0.27 keV. The photon yield and electron yield at 2.82 keV are measured to be (32.3±0.3) photons/keV and (40.6±0.5) electrons/keV, respectively, in agreement with other measurements and with NEST predictions. The electron yield at 0.27 keV is also measured and it is (68.0+ 6.3− 3.7) electrons/keV. The 37Ar calibration confirms that the detector is well-understood in the energy region close to the detection threshold, with the 2.82 keV line reconstructed at (2.83±0.02) keV, which further validates the model used to interpret the low-energy electronic recoil excess previously reported by XENON1T. The ability to efficiently remove argon with cryogenic distillation after the calibration proves that 37Ar can be considered as a regular calibration source for multi-tonne xenon detectors.
