Metallic Ratio Equivalent-Time Sampling: A Highly Efficient Waveform Acquisition Method
Metallic Ratio Equivalent-Time Sampling: A Highly Efficient Waveform Acquisition Method
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DOI：
10.1109/iolts52814.2021.9486692
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发表时间：
2021-06
期刊：
影响因子：
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通讯作者：
Shuhei Yamamoto;Yuto Sasaki;Yujie Zhao;Jianglin Wei;A. Kuwana;Keno Sato;Takashi Ishida;Toshiyuki Okamoto;Tamotsu Ichikawa;Takayuki Nakatani;MinhTri Tran;Shogo Katayama;K. Hatayama;Haruo Kobayashi
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文献类型：
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作者：
Shuhei Yamamoto;Yuto Sasaki;Yujie Zhao;Jianglin Wei;A. Kuwana;Keno Sato;Takashi Ishida;Toshiyuki Okamoto;Tamotsu Ichikawa;Takayuki Nakatani;MinhTri Tran;Shogo Katayama;K. Hatayama;Haruo Kobayashi
在大规模集成电路测试中，经常使用等效时间采样技术，因为被测器件的输入信号和采样时钟是可控的;当重复输入信号施加到模拟被测器件时，其输出信号也可以是重复的。本文研究了一种基于采样频率与输入频率的金属比等效采样的波形采集方法，该方法可用于在线、短时间、简单的模拟/射频/混合信号集成电路测试。
In LSI testing, equivalent time sampling techniques are frequently used because the input signals to the device under test and the sampling clock are controllable; when the repetitive input signals are applied to the analog device under test, its output signals can be also repetitive. In this paper, we investigate an efficient waveform acquisition method with the equivalent-sampling using the metallic ratio of the sampling frequency and the input frequency, which is expected to be used for on-line, short-time and simple analog/RF/mixed-signal IC testing.