Phase-shifting Zernike phase contrast microscopy for quantitative phase measurement
Phase-shifting Zernike phase contrast microscopy for quantitative phase measurement
复制标题
用于定量相位测量的相移泽尼克相差显微镜。
DOI：
10.1364/ol.36.004305
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发表时间：
2011-11-01
期刊：
影响因子：
3.6
通讯作者：
Torcal-Milla, Francisco Jose
中科院分区：
文献类型：
--
作者：
Gao, Peng;Yao, Baoli;Torcal-Milla, Francisco Jose
Zernike相衬显微镜的扩展和相位移机制相结合，进行定量相位测量的微观物体。在圆环上构造了几十个离散的点光源用于照明。对于每个点光源，设计了三个不同水平的点状相位阶跃，它们沿着二氧化硅板上的环交替地定位，以对物波的非衍射（dc）分量执行相位延迟。这三个阶段的步骤分别通过旋转二氧化硅板来选择。因此，相位样品的定量评价可以通过相移机制。该方法具有低的“晕”和“阴影关闭”的影响，低相干噪声水平，和高的横向分辨率，由于改进的照明方案。
Zernike phase contrast microscopy is extended and combined with a phase-shifting mechanism to perform quantitative phase measurements of microscopic objects. Dozens of discrete point light sources on a ring are constructed for illumination. For each point light source, three different levels of point-like phase steps are designed, which are alternatively located along a ring on a silica plate to perform phase retardation on the undiffracted (dc) component of the object waves. These three levels of the phase steps are respectively selected by rotating the silica plate. Thus, quantitative evaluation of phase specimens can be performed via phase-shifting mechanism. The proposed method has low "halo" and "shade-off" effects, low coherent noise level, and high lateral resolution due to the improved illumination scheme.