Coherent x-ray diffraction imaging with nanofocused illumination
Coherent x-ray diffraction imaging with nanofocused illumination
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DOI：
10.1103/physrevlett.101.090801
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发表时间：
2008-08-29
影响因子：
8.6
通讯作者：
Riekel, C.
中科院分区：
文献类型：
--
作者：
Schroer, C. G.;Boye, R.;Riekel, C.
相干X射线衍射成像是一种X射线显微镜技术，具有达到远超过基于光学的X射线显微镜的衍射极限的空间分辨率的潜力。然而，在现代X射线源可用的相干剂量是有限的，设置的空间分辨率的技术的实际界限。通过将可用的相干通量聚焦到样品上，可以提高抗辐射样品的空间分辨率。一个小的黄金颗粒（大小
Coherent x-ray diffraction imaging is an x-ray microscopy technique with the potential of reaching spatial resolutions well beyond the diffraction limits of x-ray microscopes based on optics. However, the available coherent dose at modern x-ray sources is limited, setting practical bounds on the spatial resolution of the technique. By focusing the available coherent flux onto the sample, the spatial resolution can be improved for radiation-hard specimens. A small gold particle (size