Blue-light emission from sputtered Ti:SiO2 films without annealing

Blue-light emission from sputtered Ti:SiO2 films without annealing
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DOI:
10.1063/1.1745113
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发表时间:
2003-01
影响因子:
4
通讯作者:
O. Hanaizumi;K. Ono;Y. Ogawa;Toshiaki Matsumoto;H. Yoda;K. Shiraishi
O. Hanaizumi;K. Ono;Y. Ogawa;Toshiaki Matsumoto;H. Yoda;K. Shiraishi
中科院分区:
物理与天体物理2区
文献类型:
--
作者:
O. Hanaizumi;K. Ono;Y. Ogawa;Toshiaki Matsumoto;H. Yoda;K. Shiraishi

文献摘要

相似文献

Ti:SiO2溅射薄膜在室温下无需退火即可观察到蓝光发射,并且可以通过肉眼看到。光致发光光谱的峰值位于3.03-3.05 eV,半高宽范围为0.38-0.40 eV,不同吸收边能量的样品几乎相同。 SiOx 层可能有助于发射,它是 Ti 颗粒与周围 SiO2 介质之间的界面区域,Ti 颗粒的尺寸可能会影响发射效率。
Blue-light emission from Ti:SiO2 sputtered films was observed at room temperature without annealing and it could be seen by the naked eye. The peaks of photoluminescence spectra were located at 3.03–3.05 eV and full width at half maximum ranged from 0.38–0.40 eV, which were almost the same in samples having different energies of absorption edge. SiOx layers may contribute to emission, which are interfacial regions between Ti particles and surrounding SiO2 medium, and the size of Ti particles may affect the efficiency of emission.