ATLAS ITk strip sensor quality control procedures and testing site qualification
ATLAS ITk strip sensor quality control procedures and testing site qualification
复制标题
ATLAS ITk 条形传感器质量控制程序和测试场地资格
DOI:
10.1088/1748-0221/17/12/c12013
复制
发表时间:
2022
影响因子:
1.3
通讯作者:
S. Zenz
中科院分区:
文献类型:
--
作者:
M. Mikestikova;A. Affolder;K. Affolder;S. Beaupré;G. Beck;J. Bernabéu;A. Bevan;I. Dawson;A. Dowling;V. Fadeyev;P. Federičová;J. Fernandez;A. Fournier;M. Gignac;G. Greig;J. Gunnell;K. Hara;S. Hirose;B. Hommels;T. Ishii;C. Jessiman;J. Johnson;D. Jones;S. Kachiguin;N. Kang;J. Keller;C. Klein;T. Koffas;J. Kroll;J. Kvasnička;C. Lacasta;V. Latonova;F. Martinez;P. Miyagawa;A. Montalbano;K. Nakamura;L. Poley;D. Rousso;A. Shah;E. Sláviková;C. Solaz;U. Soldevila;E. Staats;T. Stack;B. Stelzer;P. Tůma;M. Ullán;Y. Unno;J. Yarwick;S. Zenz
The high-luminosity upgrade of the Large Hadron Collider, scheduled to become operational in 2029, requires the replacement of the ATLAS Inner Detector with a new all-silicon Inner Tracker. Radiation hard n+-in-p micro-strip silicon sensors were developed by the ATLAS Inner Tracker strip collaboration and are produced by Hamamatsu Photonics K.K. Production of the total amount of 22000 strip sensors has started in 2020 and will continue until 2025. The ATLAS strip sensor collaboration has the responsibility to monitor the quality of the fabricated devices by performing detailed measurements of individual sensor characteristics and by comparing the obtained results with the tests done by the manufacturer. Dedicated Quality Control procedures were developed to check whether the delivered large-format sensors adhere to the ATLAS specifications. The institutes performing the Quality Control testing of the pre-production and production ATLAS ITk strip sensors had to initially be qualified for multiple high-throughput tests by successfully completing the Site Qualification process. The Quality Control procedures and the qualification process are described in this paper.
DOI:
10.1016/j.nima.2016.03.042
发表时间:
2016
期刊:
Accelerators, Spectrometers, Detectors and Associated Equipment
影响因子:
--
作者:
Hommels L
通讯作者:
Hommels L