DC analysis of circuits with idealized diodes considering reverse bias breakdown phenomenon

DC analysis of circuits with idealized diodes considering reverse bias breakdown phenomenon
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考虑反向偏压击穿现象的理想化二极管电路的直流分析

DOI:
10.1109/81.563621
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发表时间:
1997
影响因子:
5.1
通讯作者:
M. Tadeusiewicz
M. Tadeusiewicz
中科院分区:
工程技术2区
文献类型:
--
作者:
M. Tadeusiewicz

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本文研究了含有理想二极管的阻性电路。二极管由三段特性表示,使我们能够考虑反向偏置击穿现象的影响。开发了一种参数表示法,从而得到对电路的明确描述。结果表明,该方程总有至少一个解,并且包含所有解的区域很容易确定。给出了解唯一的充要条件。详细讨论了寻找电路的唯一或多个直流解的问题。结果表明,牛顿-拉夫森算法可以非常有效地确定问题的唯一解。雅可比矩阵的结构使得在每次迭代时显著改进解线性联立方程的过程成为可能。利用参数方程的一些性质,提出了一种算法,使我们能够确定这类电路的所有直流解。此外,还对电路的计算提出了一些建议,包括更接近实际的二极管和晶体管模型。文中给出了几个数值算例,验证了该方法的有效性。
The resistive circuits containing idealized diodes are considered in this paper. The diodes are represented by three-segment characteristics enabling us to take into account the effect of reverse bias breakdown phenomenon. A parametric representation is developed leading to a well-defined description of the circuits. It is shown that this equation always has at least one solution and a region containing all the solutions can be easily determined. The necessary and sufficient conditions for uniqueness of the solution are also developed. The problem of finding a unique or multiple dc solutions of the circuits is considered in detail. It is shown that the Newton-Raphson algorithm can be used, in a very effective way, to determine a unique solution. The structure of the Jacobian matrix makes it possible to considerably improve the process of solving linear simultaneous equations at each iteration. Exploiting some properties of the parametric equation an algorithm is developed enabling us to determine all the dc solutions of this class of circuits. Moreover, some suggestions are given concerning computation of circuits including more realistic models of diodes and transistors. Several numerical examples are presented conforming usefulness of the proposed approach.
一种求解非线性电阻电路全解的高效算法
DOI: --
发表时间: 2004
期刊: Proceedings of IEEE 2004 International Conference on Communications, Circuits and Systems II
影响因子: --
作者:
Kiyotaka Yamamura;Akinori Machida;Kiyotaka Yamamura
通讯作者: Kiyotaka Yamamura