Laserwire at the Accelerator Test Facility 2 with submicrometer resolution
Laserwire at the Accelerator Test Facility 2 with submicrometer resolution
复制标题
加速器测试设施 2 上的 Laserwire 具有亚微米分辨率
DOI：
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发表时间：
2014
期刊：
影响因子：
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通讯作者：
N. Terunuma
中科院分区：
文献类型：
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作者：
L. Nevay;S. Boogert;P. Karataev;K. Kruchinin;L. Corner;D. Howell;R. Walczak;A. Aryshev;J. Urakawa;N. Terunuma
激光线横向电子束尺寸测量系统已经在KEK的加速器测试设施2 （ATF2）上开发和运行。开发了特殊的电子束光学系统，在激光线位置产生约1 x 100 {mu}m（垂直x水平）的电子束，使用波长为532 nm的150 mJ， 71 ps的激光脉冲进行轮廓。激光传播的精确特性允许由激光发散引起的电子束的非高斯横向分布被反卷积。最小垂直电子束尺寸为1.07 ${pm}$ 0.06 (stat.) ${pm}$ 0.05 （sys.）测量{mu}m。在进行激光线测量时，改变了垂直聚焦四极杆，测得投影垂直发射度为82.56 ${pm}$ 3.04 pm rad。
A laserwire transverse electron beam size measurement system has been developed and operated at the Accelerator Test Facility 2 (ATF2) at KEK. Special electron beam optics were developed to create an approximately 1 x 100 {mu}m (vertical x horizontal) electron beam at the laserwire location, which was profiled using a 150 mJ, 71 ps laser pulse with a wavelength of 532 nm. The precise characterisation of the laser propagation allows the non-Gaussian transverse profiles of the electron beam caused by the laser divergence to be deconvolved. A minimum vertical electron beam size of 1.07 ${pm}$ 0.06 (stat.) ${pm}$ 0.05 (sys.) {mu}m was measured. A vertically focussing quadrupole just before the laserwire was varied whilst making laserwire measurements and the projected vertical emittance was measured to be 82.56 ${pm}$ 3.04 pm rad.