Statistical threshold formulation for dynamic Idd test
Statistical threshold formulation for dynamic Idd test
复制标题
动态 Idd 测试的统计阈值公式
DOI：
10.1109/tcad.2002.1004313
复制
发表时间：
2002
期刊：
影响因子：
--
通讯作者：
B. Vinnakota
中科院分区：
文献类型：
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作者：
Wanli Jiang;B. Vinnakota
动态I/sub dd/技术可以潜在地解决传统测试技术和Idd，test的局限性。制造中的正常工艺变化以两种方式影响动态Idd技术。由于无故障电路可以产生一系列响应，因此需要使用基于阈值的测试过程。工艺变化也降低了分辨率，从而降低了测试技术的故障覆盖率。作者开发的统计技术，以设置阈值在一个动态的Idd测试过程。这些技术使用主成分分析，一种统计分析技术。以识别过程角点并计算统计模型。我们的技术适用于平均电流为基础的动态测试和测试的基础上的能源消耗率（ECR）。ECR是一种新的测试指标，它提供了几个优点，包括容忍过程变化，比其他动态测试技术。作者证明，他们的技术导致计算效率高的方法来设置准确的阈值，没有显着的产量或故障覆盖率损失。据他们所知，这是第一个为动态I/sub dd/ test方法设置阈值的系统技术。
Dynamic I/sub dd/ techniques can potentially address the limitations of traditional test techniques and the Idd, test. Normal process variations in manufacturing affect dynamic Idd techniques in two ways. Since a fault-free circuit can produce a range of responses, they necessitate the use of a threshold-based test process. Process variations also degrade the resolution and consequently the fault coverage of a test technique. The authors develop statistical techniques to set thresholds in a dynamic Idd test process. The techniques use Principal Component Analysis, a statistical analysis technique,. to identify process corners and compute statistical models. Our techniques are applied to average current-based dynamic tests and to tests based on the energy consumption ratio (ECR). The ECR is a new test metric which offers several advantages, including tolerance to process variations, over other dynamic test techniques. The authors demonstrate that their techniques lead to computationally efficient methods to set accurate thresholds without either significant yield or fault coverage loss. To the best of their knowledge, this is the first systematic technique to set thresholds for a dynamic I/sub dd/ test method.