All polarization properties of PLZT ferroelectric ceramics observed in two dimensional distributions under applied voltage by the Mueller matrix

All polarization properties of PLZT ferroelectric ceramics observed in two dimensional distributions under applied voltage by the Mueller matrix
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Mueller 矩阵在施加电压下以二维分布观察到的 PLZT 铁电陶瓷的所有极化特性

DOI:
10.1016/j.sna.2012.11.023
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发表时间:
2013
期刊:
Sensors and Actuators A : Physical
影响因子:
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通讯作者:
Yukitoshi Otani
Yukitoshi Otani
中科院分区:
--
文献类型:
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作者:
Makoto Ginya;Yasuhiro Mizutani;Tetsuo Iwata;Yukitoshi Otani

文献摘要

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本文研究了反铁电PLZT-8.9/65/35(锆钛酸铅镧)陶瓷的极化特性随外加电压的空间分布。PLZT在光学器件中的应用需要了解其光学特性的分布。然而,双折射测量,这是一种观察光学特性分布的通用方法,对于其他偏振特性的评估没有用。因此,为了定量测量所有的偏振特性,我们将重点放在描述所有偏振特性的Mueller矩阵上。首先,为了评价不基于偏振特性的空间分布的光学器件的PLZT的光学特性,使用双旋转延迟器偏振计测量作为每个偏振特性的平均值的所有积分偏振特性。然后,这些结果被用来评估使用偏振计结合显微镜测量的偏振特性分布的显著性,这使得能够检测Mueller矩阵的空间分布。我们已经观察到,双折射表示依赖于晶粒结构的分布。随着电压的增加,双折射由外电场定向。因此,可以通过保持电极化的方向来实现双折射的变化的减小,并且该减小导致去偏振的减小。这些测量结果有助于揭示铁电陶瓷的光学行为,并为光学器件的研制提供有用的信息。
This paper describes spatial distributions of all polarization properties of anti-ferroelectric PLZT-8.9/65/35 (lead lanthanum zirconate titanate) ceramics as a function of the applied voltage. The application of PLZT in optical devices requires an understanding of the distributions of its optical characteristics. However, birefringence measurement, which is a general method for observing the distribution of optical characteristics, is not useful for the evaluation of other polarization properties. For the quantitative measurement of all of the polarization properties, therefore, we focused on the Mueller matrix, which describes all of the polarization properties. Initially, in order to evaluate the optical characteristics of PLZT for optical devices that are not based on the spatial distributions of the polarization properties, all of the integral polarization properties, which are the averages of each polarization property, were measured using a dual-rotating retarder polarimeter. These results were then used to valuate the significance of the polarization property distributions measured using the polarimeter combined with a microscope, which enabled detection of the spatial distributions of the Mueller matrix. We have observed that birefringence indicates the distributions that depend on the grain structure. With increasing voltage, the birefringence is oriented by the external electric field. Thus, a reduction of the variation in the birefringence can be achieved by maintaining direction of the electrical polarization, and this reduction causes a decrease in the depolarization. These measurements are useful for revealing the optical behavior of ferroelectric ceramics, and provide helpful information for the development of optical devices.