Practical applications of nonlinear measurements

Practical applications of nonlinear measurements
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非线性测量的实际应用

DOI:
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发表时间:
2009
期刊:
ARFTG Microwave Measurement Conference
影响因子:
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通讯作者:
K. Remley
K. Remley
中科院分区:
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文献类型:
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作者:
K. Remley

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我们将线性、基于vna的测量(涉及单个频率分量的幅度和相位的比率)与非线性器件和电路的测量进行了对比,其中频率分量与嵌入器件的实际阻抗之间的相对相位很重要。介绍并比较了为满足这些要求而设计的几种仪器的结构和校准技术。给出了这些仪器在非线性电路测量和模型开发中的应用实例。
We contrast linear, VNA-based measurements, involving ratios of the magnitude and phase of individual frequency components, to measurements of nonlinear devices and circuits, where the relative phase between frequency components and the actual impedance in which a device is embedded are important. The architectures and calibration techniques for several types of instruments designed to satisfy these requirements are presented and compared. Examples of the use of these instruments for measurement and model development of nonlinear circuits are presented.