THE RESOLUTION OF TOF LOW-Q DIFFRACTOMETERS - INSTRUMENTAL, DATA ACQUISITION AND REDUCTION FACTORS
THE RESOLUTION OF TOF LOW-Q DIFFRACTOMETERS - INSTRUMENTAL, DATA ACQUISITION AND REDUCTION FACTORS
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DOI:
10.1107/s0021889888005229
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发表时间:
1988-12-01
影响因子:
6.1
通讯作者:
HJELM, RP
中科院分区:
文献类型:
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作者:
HJELM, RP