Diffuse reflection of ultracold neutrons from low-roughness surfaces
Diffuse reflection of ultracold neutrons from low-roughness surfaces
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DOI：
10.1140/epja/i2010-10926-x
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发表时间：
2010-03
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通讯作者：
F. Atchison;M. Daum;R. Henneck;S. Heule;M. Horisberger;M. Kasprzak;K. Kirch;A. Knecht;M. Kuźniak;B. Lauss;A. Mtchedlishvili;M. Meier;G. Petzoldt;C. Plonka-Spehr;R. Schelldorfer;U. Straumann;G. Zsigmond
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作者：
F. Atchison;M. Daum;R. Henneck;S. Heule;M. Horisberger;M. Kasprzak;K. Kirch;A. Knecht;M. Kuźniak;B. Lauss;A. Mtchedlishvili;M. Meier;G. Petzoldt;C. Plonka-Spehr;R. Schelldorfer;U. Straumann;G. Zsigmond
我们报道了超冷中子在不同费米势材料、低表面粗糙度的大面积平板上的反射测量。实验结果被用来检验两种漫反射模型：著名的Lambert模型和基于波散射的微粗糙度模型。Lambert模型无法再现漫反射数据。由微观粗糙度模型拟合得到的表面粗糙度带关联长度在1b3 nm和10w120 nm范围内，与原子力显微镜的独立测量结果定性一致。
We report a measurement of the reflection of ultracold neutrons from flat, large-area plates of different Fermi potential materials with low surface roughness. The results were used to test two diffuse reflection models, the well-known Lambert model and the micro-roughness model which is based on wave scattering. The Lambert model fails to reproduce the diffuse reflection data. The surface roughnessband correlation lengthw, obtained by fitting the micro-roughness model to the data are in the range 1b3 nm and 10w120 nm, in qualitative agreement with independent measurements using atomic force microscopy.