High spatial resolution characterization of silicon solar cells using thermoreflectance imaging
High spatial resolution characterization of silicon solar cells using thermoreflectance imaging
复制标题
使用热反射成像对硅太阳能电池进行高空间分辨率表征
DOI：
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发表时间：
2011
期刊：
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通讯作者：
J. Hudgings
中科院分区：
文献类型：
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作者：
Qiaoer Zhou;Xiaolin Hu;K. Al;K. Mccarthy;L. Domash;J. Hudgings
热反射成像被证明是一种高分辨率、非接触式的定量表征器件性能和识别传统多晶硅太阳能电池中的电分流的方法。结果与商业锁定红外热成像系统在定量上一致，但在空间分辨率上提供了一个数量级的改进。高分辨率热反射成像能够提取定量的、空间分辨的器件性能特征，包括局部IV曲线和局部二极管理想因数，提供了传统批量电池测试无法获得的性能限制缺陷的详细物理表征。最后，热反射图提供了一种简单的方法来量化热参数，如热扩散率和热导率，这是关键的现场性能指标。
Thermoreflectance imaging is shown to be a high resolution, non-contact method of quantitatively characterizing device performance and identifying electrical shunts in conventional multicrystalline silicon solar cells. Results are in quantitative agreement with a commercial lock-in infrared thermography system but offer an order of magnitude improvement in spatial resolution. Highly resolved thermoreflectance imaging enables extraction of quantitative, spatially resolved device performance characteristics, including local IV curves and local diode ideality factors, offering detailed physical characterization of performance-limiting defects that cannot be obtained from conventional bulk cell testing. Finally, thermoreflectance maps of heat spreading from a point defect provide a simple means of quantifying thermal parameters such as thermal diffusivity and thermal conductivity, which are key field performance indicators.