Relationship among reflectance‐difference spectroscopy, surface photoabsorption, and spectroellipsometry
Relationship among reflectance‐difference spectroscopy, surface photoabsorption, and spectroellipsometry
复制标题
反射差光谱、表面光吸收和光谱椭圆光度法之间的关系
DOI：
10.1063/1.109890
复制
发表时间：
1993
影响因子：
4
通讯作者：
L. Florez
中科院分区：
文献类型：
--
作者：
K. Hingerl;D. Aspnes;I. Kamiya;L. Florez
From the reflectance expressions for a thin biaxial layer on an isotropic substrate we relate reflectance‐difference spectroscopy (RDS), surface photoabsorption (SPA), and spectroellipsometry. Using these results and our recently acquired RD database, we determine surface reconstructions present during flow‐modulated organometallic chemical vapor growth of epitaxial GaAs from SPA data that were published by others.
