Ultra trace analysis of refractory metals by solid state mass spectrometry — A comparison of GDMS, SSMS and SIMS
Ultra trace analysis of refractory metals by solid state mass spectrometry — A comparison of GDMS, SSMS and SIMS
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采用固态质谱法对难熔金属进行超痕量分析 — GDMS、SSMS 和 SIMS 的比较
DOI：
10.1007/bf01199507
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发表时间：
1987
期刊：
影响因子：
--
通讯作者：
H. Beske
中科院分区：
文献类型：
--
作者：
H. Beske
采用火花源质谱对钨、钼进行了分析。在用光电板进行离子检测的情况下，检出限在0.1μg/g范围内，无标样分析的准确度优于±2倍。
Spark source mass spectrometry has been used for the analysis of tungsten and molybdenum. In the case of ion detection with photoplates, the detection limit is in the range of 0.1μg/g. The accuracy of analysis without standards is better than a factor ±2.