Path-separated electron interferometry in a scanning transmission electron microscope
Path-separated electron interferometry in a scanning transmission electron microscope
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扫描透射电子显微镜中的路径分离电子干涉测量
DOI：
10.1088/1361-6463/aabc47
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发表时间：
2018
期刊：
影响因子：
--
通讯作者：
B. McMorran
中科院分区：
文献类型：
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作者：
F. Yasin;Tyler R. Harvey;J. Chess;J. Pierce;B. McMorran
我们报道了一种扫描电子显微镜中的路径分离式电子干涉仪。在这一装置中，我们使用纳米叠层光栅作为分幅分束器来制备多个空间分离的相干电子探针光束。我们实现了30 nm的路径间隔。 +1级衍射级探头通过无定形碳，0级和 −1级探头通过真空。然后使探头通过成像光学进行干涉，我们在CCD探测器上观察到干涉图样，条纹可见度高达39.7%。我们给出了初步的实验结果，其中干涉图案是在通过测试相位对象的衍射探针的一维扫描期间记录的。这些结果与样品厚度的独立测量所预测的模型干涉定性一致。这种实验设计有可能应用于相衬成像和基础物理实验，例如探索电子波包的相干长度。
We report a path-separated electron interferometer within a scanning transmission electron microscope. In this setup, we use a nanofabricated grating as an amplitude-division beamsplitter to prepare multiple spatially separated, coherent electron probe beams. We achieve path separations of 30 nm. We pass the +1 diffraction order probe through amorphous carbon while passing the 0th and −1 orders through vacuum. The probes are then made to interfere via imaging optics, and we observe an interference pattern at the CCD detector with up to 39.7% fringe visibility. We show preliminary experimental results in which the interference pattern was recorded during a 1D scan of the diffracted probes across a test phase object. These results qualitatively agree with a modeled interference predicted by an independent measurement of the specimen thickness. This experimental design can potentially be applied to phase contrast imaging and fundamental physics experiments, such as an exploration of electron wave packet coherence length.
透射电子显微镜
DOI：
10.1007/978-3-319-26651-0_3
发表时间：
2016
期刊：
--
影响因子：
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作者：
Burke M
通讯作者：
Burke M