Application of electron backscatter diffraction in facet crystalline orientation study of Al-Cu-Fe alloy

Application of electron backscatter diffraction in facet crystalline orientation study of Al-Cu-Fe alloy
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电子背散射衍射在Al-Cu-Fe合金晶面取向研究中的应用

DOI:
10.1016/j.matchar.2022.112158
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发表时间:
2022
影响因子:
4.7
通讯作者:
Klein, Clay
Klein, Clay
中科院分区:
材料科学1区
文献类型:
--
作者:
Li, Chunfei;Dubovi, Josiah;Klein, Clay

文献摘要

被引文献

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晶面是单晶的平坦面,其通常平行于低能晶格平面。刻面的方向有时可以通过简单的视觉检查来确定,如宝石行业的情况。微尺度颗粒上的小面往往不符合平衡的预期结果,较小的物理尺寸在观察中提出了挑战。以Al 60 Cu 25 Fe 15合金中直径为20 μm的球形颗粒上观察到的小面为例,提出了一种基于扫描电子显微镜(SEM)和电子背散射衍射(EBSD)相结合的小面取向测定方法。在发现的三种类型的刻面中,一种类型的晶体取向通过两种方法确定:通过检查刻面相对布局和基于使用SEM-EBSD的取向分析。前者是沿着传统的视觉检查路线,后者代表了在不同领域扩展EBSD应用的尝试。这两种方法都证明了刻面的表面平行于立方相的{100}晶格平面。讨论了实验细节和SEM-EBSD在这类应用中的优势。
Facets are flat faces of a single crystal, which are typically parallel to the low-energy lattice planes. The orientation of a facet can sometimes be determined by simple visual examination, as in the case of the gemstone industry. Facets on microscale particles often do not correspond to the expected results of equilibrium, and the smaller physical size presents a challenge in observation. Using a facet observed on spherical particles of 20 μm diameter in alloys of Al60Cu25Fe15composition as an example, a procedure to determine facet orientation based on the combined usage of Scanning Electron Microscope (SEM) and Electron Backscatter Diffraction (EBSD) has been proposed and tested. Out of three types of facets found, the crystalline orientation of one type is determined by two approaches: by examination of facet relative layout and by orientation analysis based on the usage of SEM-EBSD. The former is along the traditional line of visual examination and the latter represents an attempt to expand the application of EBSD in a different field. Both approaches proved that the surface of the facet is parallel to the {100} lattice plane of a cubic phase. The experimental details and the strength of SEM-EBSD in such application are discussed.