Nobuyuki Sano et al.: "Influence of Intrinsic Current Fluctuation in Very Small Si-MOSFETs"Proc.International Conference on Solid State Devices and Materials (SSDM-99). 22-23 (1999)
Nobuyuki Sano et al.: "Influence of Intrinsic Current Fluctuation in Very Small Si-MOSFETs"Proc.International Conference on Solid State Devices and Materials (SSDM-99). 22-23 (1999)
复制标题
Nobuyuki Sano 等人:“Influence of Intrinsic Current Fluctuation in Very Small Si-MOSFETs”Proc.International Conference on Solid State Devices and Materials (SSDM-99)。
DOI:
--
复制
发表时间:
--
期刊:
影响因子:
--
通讯作者:
中科院分区:
文献类型:
--
作者: