On potential fault detection in sequential circuits
On potential fault detection in sequential circuits
复制标题
时序电路潜在故障检测
DOI：
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发表时间：
1996
期刊：
影响因子：
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通讯作者：
I. Pomeranz
中科院分区：
文献类型：
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作者：
E. Rudnick;J. Patel;I. Pomeranz
在故障模拟期间，实践中经常使用的近似是在已经潜在地检测到预定次数之后宣布要检测到故障。这种近似可能导致声明检测到故障，而实际上在标准测试应用过程中不会检测到故障。我们提出了一种替代措施的故障检测潜在检测到的故障，这是很容易计算，但其准确性显着高于基于故障被潜在检测到的次数的措施。实验结果表明，支持新措施的准确性。
During fault simulation, an approximation frequently used in practice is to declare a fault to be detected after it has been potentially detected a predetermined number of times. This approximation may lead to declaring a fault detected when in fact the fault will not be detected during a standard test application process. We propose an alternative measure of fault detection for potentially detected faults, that is easy to compute, yet its accuracy is significantly higher than the measure based on the number of times a fault is potentially detected. Experimental results are shown to support the accuracy of the new measure.