Data Analysis Techniques for CMOS Technology Characterization and Product Impact Assessment
Data Analysis Techniques for CMOS Technology Characterization and Product Impact Assessment
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CMOS 技术表征和产品影响评估的数据分析技术
DOI：
10.1109/test.2006.297743
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发表时间：
2006
期刊：
影响因子：
--
通讯作者：
M. Ketchen
中科院分区：
文献类型：
--
作者：
A. Gattiker;M. Bhushan;M. Ketchen
开发了一种基于规范视图的方法，以促进快速分析 CMOS 特性以及产品和工艺调试的测试数据。压缩表示有助于数据的定量和直观同化，重点关注模型与硬件的相关性和制造可变性
A methodology based on canonical views is developed to facilitate rapid analysis of CMOS characterization and test data for product and process debug. The compressed representations aid in both quantitative and intuitive assimilation of the data, with a focus on model-to-hardware correlation and manufacturing variability