Sensitive Direct Converting X-Ray Detectors Utilizing Crystalline CsPbBr3 Perovskite Films Fabricated via Scalable Melt Processing
Sensitive Direct Converting X-Ray Detectors Utilizing Crystalline CsPbBr3 Perovskite Films Fabricated via Scalable Melt Processing
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DOI：
10.1002/admi.201901575
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发表时间：
2020-01-20
影响因子：
5.4
通讯作者：
Brabec, Christoph J.
中科院分区：
文献类型：
--
作者：
Matt, Gebhard J.;Levchuk, Ievgen;Brabec, Christoph J.
这里报道了一种基于无机金属卤化物钙钛矿 CsPbBr3 的 X 射线探测器的制造，该探测器利用简单、可扩展且成本敏感的熔体加工直接在任何尺寸的基底上进行。对几个 100 mm 厚的熔融加工薄膜进行的 X 射线衍射分析证实了 cm(2) 范围内的晶域。 CsPbBr3 薄膜的电阻为 8.5 G Ω cm，空穴迁移率为 18 cm(2) V-1 s(-1)。证明了在 1.2 x 10(4) V cm(-1) 电场下 X 射线到电流的转换率为 1450 mC Gy(air)(-1) cm(-2)，检测限在亚 mu Gy(air) s(-1) 范围内。熔融加工的 CsPbBr3 薄膜的高结晶度和化学纯度被认为是其性能与当前最先进的基于 Cd(Zn)Te 的 X 射线探测器技术相当的原因。
Here the fabrication of an inorganic metal-halide perovskite CsPbBr3 based X-ray detector is reported utilizing a simple, scalable, and cost-sensitive melt processing directly on substrate of any size. X-ray diffraction analysis on the several 100 mm thick melt processed films confirms crystalline domains in the cm(2) range. The CsPbBr3 film features a resistance of 8.5 G omega cm and a hole mobility of 18 cm(2) V-1 s(-1). An X-ray to current conversion rate of 1450 mC Gy(air)(-1) cm(-2) at an electric field of 1.2 x 10(4) V cm(-1) and a detection limit in the sub mu Gy(air) s(-1) regime is demonstrated. The high crystallinity and chemical purity of the melt processed CsPbBr3 films are suggested to be responsible for a performance which is on par to current state-of-the-art Cd(Zn)Te based X-ray detector technology.