Measurement of nanometer electron beam sizes with laser interference using Shintake Monitor
Measurement of nanometer electron beam sizes with laser interference using Shintake Monitor
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使用 Shintake Monitor 通过激光干涉测量纳米电子束尺寸
DOI：
10.1016/j.nima.2013.11.041
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发表时间：
2014
期刊：
影响因子：
--
通讯作者：
Junji Urakawa
中科院分区：
文献类型：
--
作者：
Jacqueline Yan;Yohei Yamaguchi;Yoshio Kamiya;Sachio Komamiya;Masahiro Oroku;Toshiyuki Okugi;Nobuhiro Terunuma;Kiyoshi Kubo;Toshiaki Tauchi;Junji Urakawa
Shintake监测器是安装在ATF 2的相互作用点（IP）[1]的基本光束调谐设备，ATF 2是加速器测试设备（ATF）的最终焦点测试光束线，用于测量其纳米级垂直光束尺寸（σy）。电子束与激光干涉条纹的目标碰撞，σy由下游光子探测器测量的康普顿信号光子的调制深度得出。通过在几种激光交叉角模式之间切换，它可以适应从20纳米到几微米的广泛σy范围，精度优于10%。由于这种巧妙的技术，Shintake准直器1 [2]，[3]是唯一能够测量σy λ <100 nm的现有设备，并且对于验证ATF 2的目标1（将σy λ聚焦到37 nm的设计值）至关重要。Shintake Monitor已经证明了稳定的σy测量，稳定性为5-10%。硬件和测量方案的重大改进有助于抑制误差源。本文介绍了Shintake监测器的设计概念和束流时间性能，以及为了从测量的调制度中精确地提取σy γ而对系统误差进行的广泛研究。
The Shintake Monitor is an essential beam tuning device installed at the interaction point (IP) of ATF2 [1], the final focus test beam line of the Accelerator Test Facility (ATF) to measure its nanometer order verticale−beam sizes (σy⁎). Thee−beam collides with a target of laser interference fringes, andσy⁎is derived from the modulation depth of the resulting Compton signal photons measured by a downstream photon detector. By switching between several laser crossing angle modes, it is designed to accommodate a wide range ofσy⁎from 20 nm to a few micrometers with better than 10% accuracy. Owing to this ingenious technique, Shintake Monitor1[2], [3] is the only existing device capable of measuringσy⁎<100 nm, and is crucial for verifying ATF2's Goal 1 of focusingσy⁎down to the design value of 37 nm. Shintake Monitor has demonstrated stableσy⁎measurement with 5–10% stability. Major improvements in hardware and measurement schemes contributed to the suppression of error sources. This paper describes the design concepts and beam time performance of Shintake Monitor, as well as an extensive study of systematic errors with the aim of precisely extractingσy⁎from the measured modulation.
ATF2 纳米光束尺寸监测器
DOI：
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发表时间：
2010
期刊：
Nuclear Instruments and Methods in Physics Research A 616
影响因子：
--
作者：
Taikan Suehara;et al.
通讯作者：
et al.
e+e− 线性对撞机纳米光束尺寸监测器的提案
DOI：
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发表时间：
1992
期刊：
影响因子：
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作者：
T. Shintake
通讯作者：
T. Shintake