Probing the Electronic Band Gap of Solid Hydrogen by Inelastic X-Ray Scattering up to 90 GPa
Probing the Electronic Band Gap of Solid Hydrogen by Inelastic X-Ray Scattering up to 90 GPa
复制标题
通过高达 90 GPa 的非弹性 X 射线散射探测固体氢的电子带隙
DOI：
10.1103/physrevlett.126.036402
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发表时间：
2021
影响因子：
8.6
通讯作者：
Shu, Jinfu
中科院分区：
文献类型：
--
作者：
Li, Bing;Ding, Yang;Kim, Duck Young;Wang, Lin;Weng, Tsu-Chien;Yang, Wenge;Yu, Zhenhai;Ji, Cheng;Wang, Junyue;Shu, Jinfu
氢的金属化是现代物理学中的一个关键问题，它是指氢的电子能带在压力作用下从宽禁带绝缘体向封闭禁带金属的演化。然而，由于其非常高的能量，绝缘氢的电子带隙以前从未在压力下直接观察到。利用高亮度、高能量的同步辐射，我们研制了一种非弹性X射线探针，在金刚石压砧室中，在高压下原位获得氢的电子能带信息。在45 eV的大能量范围内测量了氢的动态结构因子。发现电子带隙从10.9到6.57 eV线性减小，从零压力到90 GPa具有8.6倍的致密化（）。
Metallization of hydrogen as a key problem in modern physics is the pressure-induced evolution of the hydrogen electronic band from a wide-gap insulator to a closed gap metal. However, due to its remarkably high energy, the electronic band gap of insulating hydrogen has never before been directly observed under pressure. Using high-brilliance, high-energy synchrotron radiation, we developed an inelastic x-ray probe to yield the hydrogen electronic band informationin situunder high pressures in a diamond-anvil cell. The dynamic structure factor of hydrogen was measured over a large energy range of 45 eV. The electronic band gap was found to decrease linearly from 10.9 to 6.57 eV, with an 8.6 times densification () from zero pressure up to 90 GPa.